AZT
associated with 9 other trademarks
Probes for scientific purposes; semiconductor testing apparatus; contact probes for testing semiconductors; probes for testing semiconductors; probes ...

Words that describe this trademark:

contact probes  testing apparatus  semiconductor testing  testing  semiconductors  purposes  scientific  apparatus  probes 

Serial Number:

79249037

Mark:

AZT

Status:

Registered

Status Date:

05-14-2019

Filing Date:

Registration Number:

5748032

Registration Date:

05-14-2019

Goods and Services:

Probes for scientific purposes; semiconductor testing apparatus; contact probes for testing semiconductors; probes for testing semiconductors; probes for testing printed circuit boards; probes for testing integrated circuits; probes for testing semiconductor integrated circuit boards; probes for testing circuit boards; parts of probes for testing printed circuit boards, namely, plungers and springs; testing apparatus for testing printed circuit boards; parts of testing apparatus for testing printed circuit boards, namely, plungers and spring; test adapters for testing printed circuit boards; test pins for testing printed circuit boards

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

02-26-2019

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

C/O SHIGA INTERNATI; GRANTOKYO SOUTH TOW

Correspondent Name:

Recent Trademark filings by this company