Trademark247.com - Trademark Search Results - semiconductor wafers

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Showing 1-10 of 10 results

	Mark Name	Mark Description
	ADE TENSOR Owned by: ADE CORPORATION Filed on: 12-15-1994 Status: Abandoned-No Statement of...	signal processors, namely computer implemented signal processors for measuring or characterizing semiconductor wafers, computer disks, tires, pr	View Details Monitor Mark Create New Watchlist
	NANOSORT Owned by: ADE CORPORATION Filed on: 11-05-1998 Status: Abandoned-Failure to Resp...	COMPUTER SOFTWARE, NAMELY COMPUTER SOFTWARE FOR ANALYZING SEMICONDUCTOR WAFERS FOR FLATNESS	View Details Monitor Mark Create New Watchlist
	STRESSTOOLS Owned by: ADE CORPORATION Filed on: 03-26-1998 Status: Cancelled-Section 8	Software for use in measuring and analyzing stress values for substrates, particularly semiconductor wafers	View Details Monitor Mark Create New Watchlist
	GALAXY Owned by: ADE CORPORATION Filed on: 03-26-1998 Status: Abandoned-Failure to Resp...	Inspection of substrates, particularly a system for inspection of semiconductor wafers, and more particularly for measurement of wafer flatness	View Details Monitor Mark Create New Watchlist
	NANOTOPOLOMETER Owned by: ADE CORPORATION Filed on: 05-12-1999 Status: Abandoned-Failure to Resp...	Device and software for the characterization of a substrate, particularly a device for the analysis of substrate data of semiconductor wafers, a	View Details Monitor Mark Create New Watchlist
	LITHOTOOLS Owned by: ADE CORPORATION Filed on: 03-26-1998 Status: Cancelled-Section 8	Software for use in measuring and analyzing flatness of substrates, particularly semiconductor wafers, and more particularly for lithographic, C	View Details Monitor Mark Create New Watchlist
	GALAXY AFS-300 Owned by: ADE CORPORATION Filed on: 03-26-1998 Status: Abandoned-Failure to Resp...	Substrate inspection system, comprising hardware and associated software for measurement of substrates, namely, semiconductor wafers, to determi	View Details Monitor Mark Create New Watchlist
	AFS-300 Owned by: ADE CORPORATION Filed on: 09-24-1999 Status: Cancelled-Section 8	Substrate inspection systems, comprising computer hardware and associated software for measurement of substrates, namely, semiconductor wafers,	View Details Monitor Mark Create New Watchlist
	METROTOOLS Owned by: ADE CORPORATION Filed on: 03-26-1998 Status: Cancelled-Section 8	Software for use in measuring thickness of substrates, particularly semiconductor wafers, and more particularly backgrind characterization, film	View Details Monitor Mark Create New Watchlist
	TENSOR Owned by: ADE CORPORATION Filed on: 11-21-1994 Status: Cancelled-Section 8	signal processors, namely computer implemented signal processors for measuring or characterizing semiconductor wafers, computer disks, tires, pr	View Details Monitor Mark Create New Watchlist

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