COMPLETEEASE
associated with 58 other trademarks
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC MEDIA DATA STORA...

Words that describe this trademark:

measuring thickness  properties semiconductor  optical properties  disk drive  based  thickness  apparatus  ellipsometer  equipment  semiconductor 

Serial Number:

76663973

Mark:

COMPLETEEASE

Status:

Renewed

Status Date:

01-11-2017

Filing Date:

Registration Number:

3298600

Registration Date:

09-25-2007

Goods and Services:

EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC MEDIA DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, INCLUDING TEMPERATURE CAUSED EFFECTS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

01-16-2007

Mark Drawing Status:

Words, Letters, and/or Numbers in Stylized From

Abandon Date:

N/A

Business Name:

N/A

Correspondent Name:

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