Trademark247.com - Trademark Search Results - core wafer systems, inc.

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Showing 1-11 of 11 results

	Mark Name	Mark Description
	TESLA VRA Owned by: CORE WAFER SYST... Filed on: 03-30-2006 Status: Abandoned-Failure to Resp...	MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABIL	View Details Monitor Mark Create New Watchlist
	TESLA SDR Owned by: CORE WAFER SYST... Filed on: 03-30-2006 Status: Abandoned-Failure to Resp...	MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABIL	View Details Monitor Mark Create New Watchlist
	TESLA PDR Owned by: CORE WAFER SYST... Filed on: 03-30-2006 Status: Abandoned-Failure to Resp...	MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABIL	View Details Monitor Mark Create New Watchlist
	TESLA LOGOS Owned by: CORE WAFER SYST... Filed on: 03-30-2006 Status: Abandoned-Failure to Resp...	MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABIL	View Details Monitor Mark Create New Watchlist
	TESLA SPR Owned by: CORE WAFER SYST... Filed on: 03-20-2006 Status: Abandoned-Failure to Resp...	MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABIL	View Details Monitor Mark Create New Watchlist
	TESLA PPR Owned by: CORE WAFER SYST... Filed on: 03-20-2006 Status: Abandoned-Failure to Resp...	MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABIL	View Details Monitor Mark Create New Watchlist
	TESLA NEWTON Owned by: CORE WAFER SYST... Filed on: 03-20-2006 Status: Abandoned-Failure to Resp...	MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABIL	View Details Monitor Mark Create New Watchlist
	TESLA SUITE Owned by: CORE WAFER SYST... Filed on: 03-20-2006 Status: Abandoned-Failure to Resp...	MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABIL	View Details Monitor Mark Create New Watchlist
	PDQ-WLR Owned by: CORE WAFER SYST... Filed on: 03-16-2010 Status: Cancelled-Section 8	computer software used for measuring solid-state physics phenomena to determine device reliability and parametrics in the fields of semiconducto	View Details Monitor Mark Create New Watchlist
	PDQ Owned by: CORE WAFER SYST... Filed on: 03-16-2010 Status: Cancelled-Section 8	computer software used for measuring solid-state physics phenomena to determine device reliability and parametrics in the fields of semiconducto	View Details Monitor Mark Create New Watchlist
	ASUR Owned by: CORE WAFER SYST... Filed on: 10-11-2006 Status: Abandoned-No Statement of...	Computer software for use in providing single site and multi die parallel parametric measurements, and reliability and analysis assessments for	View Details Monitor Mark Create New Watchlist

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