ECHOPROBE
associated with 5 other trademarks
Position and thickness gauge employing multiple reflection and multiple reflection technology for use in the optical and semiconductor industry

Words that describe this trademark:

thickness gauge  multiple reflection  optical semiconductor  reflection technology  technology  employing  position  gauge  reflection 

Serial Number:

78176788

Mark:

ECHOPROBE

Status:

Cancelled-Section 8

Status Date:

08-20-2010

Filing Date:

Registration Number:

2804820

Registration Date:

01-13-2004

Goods and Services:

Position and thickness gauge employing multiple reflection and multiple reflection technology for use in the optical and semiconductor industry

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

10-21-2003

Mark Drawing Status:

Typed Drawing

Abandon Date:

N/A

Business Name:

LAW OFFICE OF ANN KOO

Correspondent Name:

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