Serial Number:
79269499
Mark:
EZ-CURVE
Status:
Registered
Status Date:
03-17-2020
Filing Date:
Registration Number:
6010542
Registration Date:
03-17-2020
Instruments for measuring the curvature of a substrate on which a thin film is deposited or on which a vacuum treatment is carried out by a physical or chemical process, the substrate in question being a wafer of a metallic or semiconductor element, these instruments being used for in situ monitoring of the growth of the thin film in real time
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
12-31-2019
Owner:
Mark Drawing Status:
Standart Character Mark
Abandon Date:
N/A
Business Name:
MADAME SOPHIE GAILLARD
Correspondent Name:
