FULL WAFER ANALYSIS
associated with 0 other trademarks
ANALYTICAL AND SCIENTIFIC TESTING SERVICES FOR OTHERS, NAMELY DOSIMETRY AND ANALYSIS OF CHARACTERISTICS AND PROPERTIES OF SEMICONDUCTOR WAFERS

Words that describe this trademark:

characteristics properties  analytical scientific  semiconductor wafers  scientific testing  properties semiconductor  dosimetry  testing  analysis  wafers 

Serial Number:

76574603

Mark:

FULL WAFER ANALYSIS

Status:

Abandoned-Failure to Respond

Status Date:

03-30-2005

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

ANALYTICAL AND SCIENTIFIC TESTING SERVICES FOR OTHERS, NAMELY DOSIMETRY AND ANALYSIS OF CHARACTERISTICS AND PROPERTIES OF SEMICONDUCTOR WAFERS

Mark Description:

N/A

Class:

Scientific and technological services

Type of Mark:

Servicemark

Published for Opposition Date:

N/A

Mark Drawing Status:

Words, Letters, and/or Numbers in Stylized From

Abandon Date:

03-01-2005

Business Name:

HAVERSTOCK & OWENS LLP

Correspondent Name:

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