HEATCELL
associated with 58 other trademarks
ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA ST...

Words that describe this trademark:

optical properties  measuring thickness  properties semiconductor  based  thickness  apparatus  identify  ellipsometer  equipment  semiconductor 

Serial Number:

76710136

Mark:

HEATCELL

Status:

Cancelled-Section 8

Status Date:

04-07-2023

Filing Date:

Registration Number:

4211903

Registration Date:

09-25-2012

Goods and Services:

ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

07-10-2012

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

N/A

Correspondent Name:

Recent Trademark filings by this company