ISE
associated with 58 other trademarks
IDENTIFY EQUIPMENT, namely, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA ST...

Words that describe this trademark:

measuring thickness  properties semiconductor  optical properties  based  thickness  apparatus  identify  ellipsometer  equipment  semiconductor 

Serial Number:

76720070

Mark:

ISE

Status:

Abandoned-Failure to Respond

Status Date:

11-09-2017

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

IDENTIFY EQUIPMENT, namely, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Mark Drawing Status:

Standart Character Mark

Abandon Date:

10-14-2017

Business Name:

N/A

Correspondent Name:

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