Trademark247.com - Trademark Search Results

Showing 1-20 of 41 results

Mark Name	Mark Description
EASY-LASER EXTREME Owned by: DAMALINI AB Filed on: 09-06-2005 Status: N/A	MEASURING AND ALIGNMENT SYSTEM FOR USE IN MEASUREMENT OF SHAFT ALIGNMENT, SHEAVE ALIGNMENT AND STRAIGHTNESS, FLATNESS, PARALLELITY, PERPENDICULA	View Details Monitor Mark Create New Watchlist
TRUE LEVEL Owned by: POLYTEC USA LLC Filed on: 05-03-1993 Status: Cancelled-Section 8	electronic and electro-mechanical devices used to measure the flatness of rotating objects; namely, optical storage media, magnetic storage medi	View Details Monitor Mark Create New Watchlist
EASY-LASER Owned by: EASY-LASER AB Filed on: 09-11-1998 Status: Renewed	MEASURING AND ALIGNMENT SYSTEM FOR USE IN MEASUREMENT OF SHAFT ALIGNMENT, SHEAVE ALIGNMENT AND STRAIGHTNESS, FLATNESS, PARALLELITY, PERPENDICULA	View Details Monitor Mark Create New Watchlist
THE FLAT ONE Owned by: HEIDTMAN STEEL Filed on: 11-08-2005 Status: Abandoned-Failure to Resp...	Stress-free steel sheets used for flatness critical applications	View Details Monitor Mark Create New Watchlist
MICROSCAN Owned by: KLA-TENCOR CORP... Filed on: 08-04-1989 Status: Cancelled-Section 8	COMPUTER BASED STATION FOR THE AUTOMATIC CHARACTERIZATION OF SEMICONDUCTOR WAFERS AS TO THICKNESS, GLOBAL AND SITE FLATNESS, BOW, WARP, CONDUCTI	View Details Monitor Mark Create New Watchlist
NANOSORT Owned by: ADE CORPORATION Filed on: 11-05-1998 Status: Abandoned-Failure to Resp...	COMPUTER SOFTWARE, NAMELY COMPUTER SOFTWARE FOR ANALYZING SEMICONDUCTOR WAFERS FOR FLATNESS	View Details Monitor Mark Create New Watchlist
E-SQUARED Owned by: KLA-TENCOR CORP... Filed on: 10-19-2001 Status: Cancelled-Section 8	Apparatus for measurement of silicon wafer thickness, flatness and shape	View Details Monitor Mark Create New Watchlist
ADVANCER Owned by: SAINT-GOBAIN CE... Filed on: 07-31-2009 Status: Abandoned-No Statement of...	ceramic gauges and associated plates for use in gaging flatness, squareness, parallelism, straightness or angles	View Details Monitor Mark Create New Watchlist
OPTICAL GLIDE Owned by: POLYTEC USA LLC Filed on: 05-03-1993 Status: Cancelled-Section 8	electronic and electro-mechanical devices used to measure the flatness of rotating objects; namely, optical storage media, magnetic storage medi	View Details Monitor Mark Create New Watchlist
FACE Owned by: FACE CONSTRUCTI... Filed on: 06-30-1995 Status: Cancelled-Section 8	electrical devices for surveying, measuring, and collecting and recording data with respect to profiles and flatness of floors, roads, bridges,	View Details Monitor Mark Create New Watchlist
FACE Owned by: FACE CONSTRUCTI... Filed on: 08-13-2003 Status: Renewed	Electrical devices for surveying, measuring, and collecting and recording data with respect to profiles and flatness of floors, roads, bridges, golf g	View Details Monitor Mark Create New Watchlist
FACE Owned by: FACE CONSTRUCTI... Filed on: 08-13-2003 Status: Renewed	Electrical devices for surveying, measuring, and collecting and recording data with respect to profiles and flatness of floors, roads, bridges, golf g	View Details Monitor Mark Create New Watchlist
LUMICAM Owned by: INSTRUMENT SYST... Filed on: 03-27-2003 Status: Renewed	[ Scientific equipment in the nature of test and measuring equipment, namely, flatness testers, surface roughness measuring instruments, galvano	View Details Monitor Mark Create New Watchlist
AUTOSORT Owned by: TROPEL, INC. Filed on: 03-10-1982 Status: Cancelled-Section 8	Computer-Controlled Wafer Flatness Tester for Automatically Inspecting, Measuring, Monitoring Test Information, and Classifying Semiconductor Wa	View Details Monitor Mark Create New Watchlist
OPTICAL CERTIFICATION Owned by: POLYTEC USA LLC Filed on: 03-03-1997 Status: Cancelled-Section 8	electronic device for checking the flatness of rotating objects	View Details Monitor Mark Create New Watchlist
VERIFLAT Owned by: SHAPELINE AB Filed on: 10-22-2009 Status: Cancelled-Section 8	Optical measuring apparatus for measuring the flatness of metals	View Details Monitor Mark Create New Watchlist
SHAPE:TRONIC SYSTEM Owned by: ANDRITZ METALS ... Filed on: 07-13-2005 Status: N/A	Measuring apparatus, namely, instruments for measuring geometic shapes and flatness of metal sheets and strips	View Details Monitor Mark Create New Watchlist
CERA-CHECK Owned by: COORSTEK, INC. Filed on: 05-16-1986 Status: Renewed	CERAMIC GAUGES AND ASSOCIATED PLATES FOR USE IN GAGING FLATNESS, SQUARENESS, PARALLELISM, STRAIGHTNESS OR ANGLES	View Details Monitor Mark Create New Watchlist
LITHOTOOLS Owned by: ADE CORPORATION Filed on: 03-26-1998 Status: Cancelled-Section 8	Software for use in measuring and analyzing flatness of substrates, particularly semiconductor wafers, and more particularly for lithographic, C	View Details Monitor Mark Create New Watchlist
WAFERSCAN Owned by: ADE CORPORATION Filed on: 02-29-1980 Status: Cancelled-Section 8	Apparatus for Electronic Non-Contacting Flatness Gaging of Semiconductor Substrates	View Details Monitor Mark Create New Watchlist

Preparing summary view, please wait...

Owner Summary

This report includes a summary of your search results. The 'Marks Matched' column indicates the number of results that match a particular trademark owner, It does not include all of their other marks.

Primary Classification Summary

Status Summary

File Year Summary

Registration Statistics

Quick Links

Updated Daily