Trademark247.com - Trademark Search Results - metrology tools

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Showing 1-12 of 12 results

	Mark Name	Mark Description
	ACUITY Owned by: TOPPAN PHOTOMAS... Filed on: 12-06-2001 Status: Cancelled-Section 8	Power equipment, namely, pattern generators, etch tools, inspection tools, metrology tools, repair tools, and photoresists, used for the manufac	View Details Monitor Mark Create New Watchlist
	OMISTRAIN Owned by: OPTICAL METROLO... Filed on: 06-03-2002 Status: Cancelled-Section 8	Optical metrology apparatus and instrumentation, namely metrology tools for 2D and 3D visualization and measurement of the deformation motion an	View Details Monitor Mark Create New Watchlist
	LUMIMAP Owned by: BRUKER NANO, IN... Filed on: 06-14-2013 Status: Cancelled-Section 8	metrology system comprising metrology tools for surface analysis and software for enhancing high performance of nanoscale metrology for in-situ	View Details Monitor Mark Create New Watchlist
	SURFACEWAVE Owned by: KONINKLIJKE PHI... Filed on: 02-03-2003 Status: Abandoned-Defective State...	THIN FILM MEASUREMENT DEVICES IN THE NATURE OF FACTORY METROLOGY TOOLS OR ANALYTICAL INSTRUMENTATION FOR MEASURING FILM THICKNESSES OR FILM LAYE	View Details Monitor Mark Create New Watchlist
	SURFACEWAVE Owned by: KONINKLIJKE PHI... Filed on: 02-01-2006 Status: Abandoned-Failure to Resp...	Thin film measurement devices in the nature of factory metrology tools or analytical instrumentation for measuring film thicknesses or film laye	View Details Monitor Mark Create New Watchlist
	AUTOMET Owned by: BRUKER NANO, IN... Filed on: 10-14-2011 Status: Renewed	Software for metrology tools, namely, analysis software for atomic force microscopes	View Details Monitor Mark Create New Watchlist
	ACUITYXR Owned by: BRUKER NANO, IN... Filed on: 10-27-2010 Status: Abandoned-Failure to Resp...	Hardware and software for enhancing high performance of nanoscale metrology tools	View Details Monitor Mark Create New Watchlist
	ACUITYXR Owned by: BRUKER NANO, IN... Filed on: 04-19-2013 Status: Renewed	metrology tools for surface analysis and software for enhancing high performance of nanoscale metrology tools	View Details Monitor Mark Create New Watchlist
	DEFINITY Owned by: TOPPAN PHOTOMAS... Filed on: 12-06-2001 Status: Cancelled-Section 8	Power equipment, namely, pattern generators, etch tools, inspection tools, metrology tools, repair tools, and photoresists, used for the manufac	View Details Monitor Mark Create New Watchlist
	LUMINEX Owned by: TOPPAN PHOTOMAS... Filed on: 12-06-2001 Status: Cancelled-Section 8	Power equipment, namely, pattern generators, etch tools, inspection tools, metrology tools, repair tools and photoresists, used for the manufact	View Details Monitor Mark Create New Watchlist
	USE THE STANDARD Owned by: LITEL INSTRUMEN... Filed on: 07-14-2003 Status: Cancelled-Section 8	metrology tools for characterizing the properties of illumination sources of photolithography steppers and step-and-scan apparatus for semicondu	View Details Monitor Mark Create New Watchlist
	PRIMEVISION Owned by: APPLIED MATERIA... Filed on: 05-27-2015 Status: Registered	Semiconductor manufacturing components, namely, defect analysis and metrology tools, namely, optical defect inspection equipment in the nature of elec	View Details Monitor Mark Create New Watchlist

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