MICRONICS JAPAN
associated with 3 other trademarks
Probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection of semiconductor devices and ...

Words that describe this trademark:

Serial Number:

97513203

Mark:

MICRONICS JAPAN

Status:

Registered

Status Date:

11-07-2023

Filing Date:

Registration Number:

7210901

Registration Date:

11-07-2023

Goods and Services:

Probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection of semiconductor devices and integrated circuits; testing, inspection, and probing instruments, namely, semiconductor testing instruments for making electrical contact with probes to semiconductor devices for use in the process of manufacture, testing, and inspection of semiconductor devices and integrated circuit; probes for testing of integrated circuits and semiconductor devices; probe stations being a positioning apparatus for connecting probes to semiconductor device electrodes for testing and inspecting integrated circuits and semiconductor devices, namely, precision instruments for manipulation and positioning of microscopic objects; probes for scientific purposes for the measurement of electronic signals; electric contacts; electrical instruments, namely, sockets and socket terminal carriers being electrical terminal blocks Repair or maintenance of probe cards for use in connection with inspection of semiconductor devices and integrated circuits; repair or maintenance of probe cards for testing integrated circuits and semiconductor devices

Mark Description:

N/A

Class:

Building construction

Type of Mark:

Trademark

Published for Opposition Date:

08-22-2023

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

SUGHRUE MION, PLLC

Correspondent Name:

Recent Trademark filings by this company