MIROVIEW
associated with 87 other trademarks
Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilit...

Words that describe this trademark:

scanning probe microscopes  atomic force microscopes  metrology instruments  apparatus software  force  microscopes  software  probe  spms  instruments 

Serial Number:

86480824

Mark:

MIROVIEW

Status:

Section 8 and 15-accepted and acknowledged

Status Date:

10-12-2022

Filing Date:

Registration Number:

4947273

Registration Date:

04-26-2016

Goods and Services:

Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilitating the operation of metrology instruments in the nature of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs)

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

05-19-2015

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

BOYLE FREDRICKSON S.C.

Correspondent Name:

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