Serial Number:
85196273
Mark:
MPROBE
Status:
Renewed
Status Date:
03-08-2023
Filing Date:
Registration Number:
4184959
Registration Date:
08-07-2012
Thin film thickness measurement systems composed of spectrometers, polychromatic light sources, namely, Tungsten-Halogen, Deuterium, Xenon; LEDs (light-emitting diodes) and fiber optics cables, optical lenses and software for data acquisition, simulation and regression provided therewith for measuring the thickness and/or refractive index of translucent films
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
02-14-2012
Owner:
Mark Drawing Status:
Standart Character Mark
Abandon Date:
N/A
Business Name:
LEO ASINOVSKI
Correspondent Name:
