MUL-T-PASS
associated with 11 other trademarks
X-ray metrology instruments for analysis and characterization of thin films, and accessories, namely, computer work stations in the nature of computer...

Words that describe this trademark:

computer work stations  metrology instruments  accessories computer  work stations  thin films  instruments  analysis  characterization  films  xray 

Serial Number:

78455277

Mark:

MUL-T-PASS

Status:

Renewed

Status Date:

07-23-2016

Filing Date:

Registration Number:

3230629

Registration Date:

04-17-2007

Goods and Services:

X-ray metrology instruments for analysis and characterization of thin films, and accessories, namely, computer work stations in the nature of computer hardware, and software for controlling the operation and processing data of such instruments

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

02-28-2006

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

N/A

Correspondent Name:

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