MVM-SEM
associated with 12 other trademarks
Optical inspection apparatus for inspection and testing of semiconductor materials, namely, photomasks

Words that describe this trademark:

optical inspection  inspection testing  testing semiconductor  semiconductor materials  inspection  materials  apparatus  photomasks 

Serial Number:

79113648

Mark:

MVM-SEM

Status:

Status Date:

03-10-2023

Filing Date:

Registration Number:

4232065

Registration Date:

10-30-2012

Goods and Services:

Optical inspection apparatus for inspection and testing of semiconductor materials, namely, photomasks

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

08-14-2012

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

NOLTE LACKENBACH SIEGEL

Correspondent Name:

Recent Trademark filings by this company