Serial Number:
74290937
Mark:
NANO-MASTER
Status:
Renewed
Status Date:
04-30-2014
Filing Date:
Registration Number:
1837350
Registration Date:
05-24-1994
overlay measurement, critical dimension measurement, and registration measurement tools; and defect inspection models and tools for use in the semiconductor manufacturing industry
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
03-01-1994
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
N/A
Business Name:
N/A
Correspondent Name: