NANOSCAN
associated with 12 other trademarks
measurement equipment for measuring the alignment between patterns on the front and back sides of a semiconductor wafer

Words that describe this trademark:

measurement equipment  measuring alignment  semiconductor wafer  alignment between  equipment measuring  front back  back sides  patterns  sides  between 

Serial Number:

76405400

Mark:

NANOSCAN

Status:

Abandoned-Failure to Respond

Status Date:

06-03-2003

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

measurement equipment for measuring the alignment between patterns on the front and back sides of a semiconductor wafer

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Mark Drawing Status:

Typed Drawing

Abandon Date:

03-07-2003

Business Name:

PETERS, VERNY, JONES & SCHMITT, L.L.P.

Correspondent Name:

Recent Trademark filings by this company