Serial Number:
86281743
Mark:
Status:
Cancelled-Section 8
Status Date:
03-08-2024
Filing Date:
Registration Number:
5271515
Registration Date:
08-22-2017
Probes for testing integrated circuits; Probes for testing semiconductors; Probe cards for use in connection with inspection of semiconductors; Probe cards for testing wafer; Testing apparatus for testing integrated circuits; Testing apparatus for testing semiconductors
Mark Description:
The mark consists of a green design of broken ellipse disposed at an angle, with the stylized characters "3DS" overlaid on the broken ellipse. The number "3" and the letter "D" each have a black lower part, a gray upper part, and a white outline. The letter "S" is orange, composed of stylized white segments in the middle slope of "S".
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
10-14-2014
Owner:
Mark Drawing Status:
Design plus Words, Letters, and/or Numbers
Abandon Date:
N/A
Business Name:
8110 GATEHOUSE ROAD, SUITE 100 EAST
Correspondent Name:
