Serial Number:
76444643
Mark:
OCDSE
Status:
Abandoned-No Statement of Use filed
Status Date:
12-18-2003
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
combination of optical metrology instruments for measuring such things as microscopic dimensions and film thickness features of samples, particularly, of semiconductor wafers, flat panel displays and magnetic media
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
03-25-2003
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
12-18-2003
Business Name:
NANOMETRICS, INCORPORATED
Correspondent Name:
