Serial Number:
76391600
Mark:
PANALYTICAL
Status:
Renewed
Status Date:
12-30-2015
Filing Date:
Registration Number:
3029656
Registration Date:
12-13-2005
Analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, x-ray fluorescence analyzers and x-ray diffraction meters for the cement, steel, aluminum, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, namely, reflectometers, spectrometers, x-ray fluorescence analyzers and x-ray diffraction meters for both silicon and compound semiconductor applications, x-ray fluorescence wafer and disc analyzers [ and automated ellipsometers ] for the silicon semiconductor industry, for analyzing film thickness, composition and density; x-ray diffraction, namely, x-ray diffraction meters for the compound semiconductor industry; x-ray tubes, not for medical purposes; operating software for industrial process control and for research and development applications
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
07-01-2003
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
N/A
Business Name:
HOGAN LOVELLS US LLP
Correspondent Name:
