PARASCAN
By: ASML NETHERLANDS B.V.
associated with 54 other trademarks
Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles

Words that describe this trademark:

semiconductor wafers  field inspection  electronic imaging  materials semiconductor  semiconductor materials  inspection  reticles  platforms  wafers  imaging 

Serial Number:

86535659

Mark:

PARASCAN

Status:

Cancelled-Section 8

Status Date:

07-15-2022

Filing Date:

Registration Number:

4879933

Registration Date:

01-05-2016

Goods and Services:

Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semiconductor wafers and reticles

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

10-20-2015

Owner:

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

46 LANE 11, GUANGFU N. RD., 11TH FLOOR

Correspondent Name:

Recent Trademark filings by this company