Serial Number:
76696428
Mark:
THZ-SE
Status:
Abandoned-Failure to Respond
Status Date:
07-20-2010
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, INCLUDING TEMPERATURE CAUSED EFFECTS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
N/A
Owner:
Mark Drawing Status:
Standart Character Mark
Abandon Date:
06-11-2010
Business Name:
N/A
Correspondent Name:
