THZ-VASE
associated with 58 other trademarks
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MED...

Words that describe this trademark:

measuring thickness  properties semiconductor  optical properties  disk drive  equipment  semiconductor  based  thickness  apparatus  ellipsometer 

Serial Number:

76696429

Mark:

THZ-VASE

Status:

Abandoned-No Statement of Use filed

Status Date:

05-16-2011

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS AND OPTICAL PROPERTIES OF SEMICONDUCTOR, DISK DRIVE, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS AND MULTIPLE LAYER FILMS ON SUBSTRATES AND COATINGS, INCLUDING TEMPERATURE CAUSED EFFECTS, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

01-19-2010

Mark Drawing Status:

Standart Character Mark

Abandon Date:

05-16-2011

Business Name:

N/A

Correspondent Name:

Recent Trademark filings by this company