Serial Number:
76707791
Mark:
THZ-VASE
Status:
Renewed
Status Date:
11-09-2021
Filing Date:
Registration Number:
4154267
Registration Date:
06-05-2012
equipment, namely, ellipsometer based apparatus for measuring thickness, temperature caused effects, and optical properties of semiconductors, disk drives, magnetic data storage media, optical data storage media, thin films, multiple layer films and coatings on substrates, and computer programs necessary for controlling the ellipsometer based apparatus and for analyzing acquired ellipsometric data
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
11-22-2011
Owner:
Mark Drawing Status:
Standart Character Mark
Abandon Date:
N/A
Business Name:
N/A
Correspondent Name:
