ULTRALITE EPD AND DESIGN
By: MOMENTUM TECHNICAL CONSULTING, INC.
associated with 2 other trademarks
Semiconductor processing machines including polish end point detection system for metal Chemical Mechanical Polishing (CMP) processes, including CMP f...

Words that describe this trademark:

metal chemical  semiconductor processing  detection system  end point  processing machines  system metal  point detection  polish  machines  including 

Serial Number:

76121559

Mark:

ULTRALITE EPD AND DESIGN

Status:

Abandoned-Failure to Respond

Status Date:

11-06-2001

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

Semiconductor processing machines including polish end point detection system for metal Chemical Mechanical Polishing (CMP) processes, including CMP for tungsten plugs

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Owner:

Mark Drawing Status:

Typed Drawing

Abandon Date:

09-06-2001

Business Name:

JACKSON WALKER, LLP

Correspondent Name:

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