ULTRALITE EPD
By: MOMENTUM TECHNICAL CONSULTING, INC.
associated with 2 other trademarks
Semiconductor processing machines including polish endpoint detection system for metal Chemical Mechanical Polishing (CMP) processes, including CMP fo...

Words that describe this trademark:

chemical mechanical polishing  metal chemical  system metal  detection system  semiconductor processing  processing machines  endpoint detection  polish  machines  including 

Serial Number:

76120833

Mark:

ULTRALITE EPD

Status:

Abandoned-Failure to Respond

Status Date:

11-06-2001

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

Semiconductor processing machines including polish endpoint detection system for metal Chemical Mechanical Polishing (CMP) processes, including CMP for tungsten plugs

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Owner:

Mark Drawing Status:

Typed Drawing

Abandon Date:

09-06-2001

Business Name:

JACKSON WALKER L L P

Correspondent Name:

Recent Trademark filings by this company