ULTRAMET
associated with 34 other trademarks
measurement equipment for measuring the alignment between patterns on the front and back sides of a semiconductor wafer for use during the manufacture...

Words that describe this trademark:

measurement equipment  measuring alignment  semiconductor wafer  alignment between  equipment measuring  front back  back sides  patterns  sides  between 

Serial Number:

76513052

Mark:

ULTRAMET

Status:

Cancelled-Section 8

Status Date:

03-02-2012

Filing Date:

Registration Number:

2977383

Registration Date:

07-26-2005

Goods and Services:

measurement equipment for measuring the alignment between patterns on the front and back sides of a semiconductor wafer for use during the manufacture of semiconductor devices, calibration masks for use with said measurement equipment, and manuals sold with said products

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

12-23-2003

Mark Drawing Status:

Typed Drawing

Abandon Date:

N/A

Business Name:

PETERS, VERNY, JONES & SCHMITT, LLP

Correspondent Name:

Recent Trademark filings by this company