Serial Number:
76272994
Mark:
WBWS
Status:
Cancelled-Section 8
Status Date:
10-19-2012
Filing Date:
Registration Number:
2547288
Registration Date:
03-12-2002
OPTICAL SYSTEM FOR MEASURING THE CURVATURE OF A SEMICONDUCTOR WAFER, COMPOSED OF A LIGHT SOURCE AND A DETECTOR AND A PROCESSOR FOR CALCULATING THE CURVATURE OF THE WAFER AND DETERMINING THE STRESS IN A FILM DEPOSITED ON THE WAFER
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
12-18-2001
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
N/A
Business Name:
STALLMAN & POLLOCK LLP
Correspondent Name:
