WOOLLAM
associated with 58 other trademarks
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS, TEMPERATURE CAUSED EFFECTS, AND OPTICAL PROPERTIES OF SEMICONDUCTORS, DISK DR...

Words that describe this trademark:

measuring thickness  thickness temperature  optical properties  apparatus  caused  ellipsometer  equipment  effects  based  temperature 

Serial Number:

76714996

Mark:

WOOLLAM

Status:

Abandoned-Failure to Respond

Status Date:

08-07-2014

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURING THICKNESS, TEMPERATURE CAUSED EFFECTS, AND OPTICAL PROPERTIES OF SEMICONDUCTORS, DISK DRIVES, MAGNETIC DATA STORAGE MEDIA, OPTICAL DATA STORAGE MEDIA, THIN FILMS, MULTIPLE LAYER FILMS AND COATINGS ON SUBSTRATES, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THE ELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRIC DATA

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Mark Drawing Status:

Standart Character Mark

Abandon Date:

07-10-2014

Business Name:

N/A

Correspondent Name:

Recent Trademark filings by this company