WOOLLAM-ISE
associated with 58 other trademarks
EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURINGTHICKNESS, TEMPERATURE CAUSED EFFECTS, AND OPTICAL PROPERTIES OFSEMICONDUCTORS, DISK DRIV...

Words that describe this trademark:

measuring thickness  properties semiconductor  optical properties  apparatus  identify  ellipsometer  equipment  thickness  based  intent 

Serial Number:

76720244

Mark:

WOOLLAM-ISE

Status:

Registered

Status Date:

10-30-2018

Filing Date:

Registration Number:

5595875

Registration Date:

10-30-2018

Goods and Services:

EQUIPMENT, NAMELY, ELLIPSOMETER BASED APPARATUS FOR MEASURINGTHICKNESS, TEMPERATURE CAUSED EFFECTS, AND OPTICAL PROPERTIES OFSEMICONDUCTORS, DISK DRIVES, MAGNETIC DATA STORAGE MEDIA, OPTICALDATA STORAGE MEDIA, THIN FILMS, MULTIPLE LAYER FILMS AND COATINGS ONSUBSTRATES, AND COMPUTER PROGRAMS NECESSARY FOR CONTROLLING THEELLIPSOMETER BASED APPARATUS AND FOR ANALYZING ACQUIRED ELLIPSOMETRICDATA

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

10-10-2017

Mark Drawing Status:

Standart Character Mark

Abandon Date:

N/A

Business Name:

N/A

Correspondent Name:

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