Serial Number:
98109935
Mark:
XACT
Status:
Notice of Allowance-Issued
Status Date:
10-15-2024
Filing Date:
Registration Number:
N/A
Registration Date:
N/A
Semiconductor wafer inspection system used to inspect wafers for darkfield defects, including particles, scratches, and humps, namely, inspection machines for the inspection of semiconductor wafers
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
08-20-2024
Owner:
Mark Drawing Status:
4
Abandon Date:
N/A
Business Name:
TWO EMBARCADERO CENTER, SUITE 1900
Correspondent Name:
