Serial Number:
73817101
Mark:
MICROSCAN
Status:
Cancelled-Section 8
Status Date:
01-15-2016
Filing Date:
Registration Number:
1619547
Registration Date:
10-30-1990
COMPUTER BASED STATION FOR THE AUTOMATIC CHARACTERIZATION OF SEMICONDUCTOR WAFERS AS TO THICKNESS, GLOBAL AND SITE FLATNESS, BOW, WARP, CONDUCTIVITY TYPE, RESISTIVITY AND OTHER PARAMETERS
Mark Description:
N/A
Class:
Scientific
Type of Mark:
Trademark
Published for Opposition Date:
08-07-1990
Owner:
Mark Drawing Status:
Typed Drawing
Abandon Date:
N/A
Business Name:
WEINGARTEN, SCHURGIN, GAGNEBIN LEBOVICI
Correspondent Name:
