SUPERSORT
associated with 29 other trademarks
SEMICONDUCTOR WAFER FLATNESS ANALYSIS AND MEASUREMENT EQUIPMENT

Words that describe this trademark:

semiconductor wafer  measurement equipment  wafer flatness  equipment  analysis  flatness 

Serial Number:

73786721

Mark:

SUPERSORT

Status:

Abandoned-Failure to Respond

Status Date:

01-16-1990

Filing Date:

Registration Number:

N/A

Registration Date:

N/A

Goods and Services:

SEMICONDUCTOR WAFER FLATNESS ANALYSIS AND MEASUREMENT EQUIPMENT

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

N/A

Mark Drawing Status:

Typed Drawing

Abandon Date:

11-27-1989

Business Name:

GENERAL SIGNAL CORPORATION

Correspondent Name:

Recent Trademark filings by this company