SUPERSORT
associated with 29 other trademarks
semiconductor wafer flatness analysis and measurement apparatus

Words that describe this trademark:

measurement apparatus  wafer flatness  semiconductor wafer  apparatus  analysis  flatness 

Serial Number:

74028054

Mark:

SUPERSORT

Status:

Cancelled-Section 8

Status Date:

03-30-1998

Filing Date:

Registration Number:

1658053

Registration Date:

09-24-1991

Goods and Services:

semiconductor wafer flatness analysis and measurement apparatus

Mark Description:

N/A

Class:

Scientific

Type of Mark:

Trademark

Published for Opposition Date:

07-02-1991

Mark Drawing Status:

Typed Drawing

Abandon Date:

N/A

Business Name:

GENERAL SIGNAL CORORATION

Correspondent Name:

Recent Trademark filings by this company